Document Details

Document Type : Thesis 
Document Title :
Study Optical, Electrical and Structural Properties of some Semiconductors Thin Films
دراسة خواص ضوئية وكهربية وتركيبية لبعض الأغشية الرقيقة لأشباه الموصلات
 
Subject : Study Optical, Electrical and Structural Properties of some Semiconductors Thin Films 
Document Language : Arabic 
Abstract : Thin films of antimony triselenide were deposited by thermal evaporation technique on optically flat surfaces of glass and quartz substrate at different substrate temperatures under vacuum . As deposited samples were subjected to heat- treatment by annealing at different temperatures in air and under vacuum. Structural studies were carried using x-ray diffraction, electron diffraction, transmission electron microscopy (TEM) and scanning electron microscopy (SEM) techniques. Electrical properties were studied for these samples The optical constant of the amorphous and crystalline films were determined from spectrophotometric measurements from 200-2400nm. The values of the energy gap were obtained ,the transitions and the dielectric constant for these samples at high frequency. 
Supervisor : dr.mahmood alnahhas dr.huda shehata 
Thesis Type : Doctorate Thesis 
Publishing Year : 1410 AH
1990 AD 
Added Date : Wednesday, December 24, 2014 

Researchers

Researcher Name (Arabic)Researcher Name (English)Researcher TypeDr GradeEmail
فاطمة سالم باهبريbahbri, fatema salemInvestigatorDoctorate 

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 37706.pdf pdf 

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